SixSense Information

SixSense builds AI systems that reduce wafer exposure and accelerate root cause analysis in semiconductor wafer fabs and assembly & test operations. We transform inspection, metrology, and test data into early containment intelligence — helping manufacturers minimize the total economic impact of yield incidents. Our product suite includes AI-ADC (AI-powered automated defect classification for optical and SEM inspection images), along with detection and traceability systems that identify systemic wafer patterns, quantify exposure, and isolate suspect tools before issues escalate into major yield events.