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Peter de Wolf Work
Director AFM Technology and Application Development @ (June 2023 - Present)
Application Director @ (January 2010 - May 2023)
Application Director @ (January 1998 - January 2010)
PHD Researcher @ (January 1994 - January 1998)
Peter de Wolf Education
KU Leuven
PhD (Electrical Engineering)
1994-1998
Ghent University
Electrical Engineering
1987-1992
Peter de Wolf Skills
AFM
CMOS
Characterization
Design of Experiments
Electronics
Failure Analysis
Instrumentation
MEMS
Materials Science
Metrology
Microelectronics
Microscopy
Nanofabrication
Nanomaterials
Nanotechnology
Optics
Physics
R&D
Scanning Electron Microscopy
Semiconductor Industry
Semiconductors
Sensors
Silicon
Spectroscopy
Technology Transfer
Thin Films
Public Speaking
Sales
Business Development
Marketing
Marketing Strategy
Peter de Wolf Summary
Peter de Wolf, is currently a Director AFM Technology and Application Development at Bruker Nano Surfaces & Metrology. Peter de Wolf brings experience from previous roles at Bruker Nano Surfaces & Metrology, Veeco Instruments and imec. Peter de Wolf holds a 1994 - 1998 PhD in Electrical Engineering @ KU Leuven. With a robust skill set that includes AFM, CMOS, Characterization, Design of Experiments, Electronics and more. Peter de Wolf has 1 emails on RocketReach.
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