Bachelor's degree (Electrical and Electronics Engineering)
1988
-
1991
Patrick Mullarkey Skills
Semiconductor Manufacturing
Semiconductors
Yield Enhancement
Product Engineering
Failure Analysis
CMOS
Device Characterization
DFT
Silicon Debug
Yield
Reliability
Semiconductor Industry
IC
Debugging
Silicon
DRAM
Mixed Signal
ASIC
Dynamic Random Access Memory Dram
Semiconductor
Dynamic Random Access Memory
Patrick Mullarkey Summary
Patrick Mullarkey, based in Boise, ID, US, is currently a Director of Product Yield Analysis at Micron Technology. Patrick Mullarkey brings experience from previous roles at Micron Technology. Patrick Mullarkey holds a 1988 - 1991 Bachelor's degree in Electrical and Electronics Engineering @ Washington State University. With a robust skill set that includes Semiconductor Manufacturing, Semiconductors, Yield Enhancement, Product Engineering, Failure Analysis and more. Patrick Mullarkey has 2 emails and 1 mobile phone numbers on RocketReach.
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