Bachelor's degree (Electrical and Electronics Engineering)
1988-1991
Patrick Mullarkey Skills
ASIC
CMOS
DFT
DRAM
Debugging
Device Characterization
Dynamic Random-Access Memory (DRAM)
Failure Analysis
IC
Mixed Signal
Product Engineering
Reliability
Semiconductor Industry
Semiconductor Manufacturing
Semiconductors
Silicon
Silicon Debug
Yield
Yield Enhancement
Dynamic Random Access Memory Dram
Semiconductor
Dynamic Random Access Memory
Patrick Mullarkey Summary
Patrick Mullarkey, based in Boise, ID, US, is currently a Director of Product Yield Analysis at Micron Technology. Patrick Mullarkey brings experience from previous roles at Micron Technology. Patrick Mullarkey holds a 1988 - 1991 Bachelor's degree in Electrical and Electronics Engineering @ Washington State University. With a robust skill set that includes ASIC, CMOS, DFT, DRAM, Debugging and more. Patrick Mullarkey has 1 emails on RocketReach.
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