JP Analytical Information

JP Analytical is a precision materials characterization laboratory specializing in thin-film metrology and advanced analytical solutions for semiconductor, energy, aerospace, defense, and emerging technologies. We provide highly accurate measurements that reveal composition, thickness, impurities, hydrogen content, and buried interfaces — enabling faster development cycles, improved yield, and reliable failure analysis. Our unique strength lies in integrating ion beam analysis with complementary surface, structural, and chemical techniques to deliver a complete understanding of complex materials systems. Core Capabilities Ion Beam Analysis (IBA) • Rutherford Backscattering Spectrometry (RBS) • Hydrogen Forward Scattering / ERDA (HFS/ERDA) • Particle-Induced X-ray Emission (PIXE) • Nuclear Reaction Analysis (NRA) Surface & Chemical Characterization • X-ray Photoelectron Spectroscopy (XPS) • Secondary Ion Mass Spectrometry (SIMS) Structural & Physical Analysis • X-ray Diffraction (XRD) & Reflectivity (XRR) • Raman Spectroscopy • X-ray Fluorescence (XRF) • Atomic Force Microscopy (AFM)