1996 -1996 Sr. FA Technician, Device Integration @ Motorola
1995 -1996 DualBeam FIB Applications Engineer @
1992 -1995 Sr. FA Technician @ Motorola HP/RISC FA Lab
1990 -1991 Hard Disc Research and Development Technician @ Komag Incorprated
James Odum Education
San Joaquin Delta College
A.A. plus 2yr Certification, Electron Microscopy (Electron Microscopy)
1986-1990
James Odum Skills
SRAM
Scanning Electron Microscopy
EDX
TEM
Product Engineering
Thin Films
Engineering
Support
Characterization
SAN
Research And Development R&D
Integrated Circuits Ic
CMOS
Semiconductor Industry
FIB
Design of Experiments
Microelectronics
Failure Analysis
Focused Ion Beam Fib
Semiconductors
Metrology
R&D
Silicon
Fab
Yield
IC
Research and Development
Focused Ion Beam
Integrated Circuits
James Odum Summary
James Odum, based in Huntsville, AL, US, is currently a Failure Analysis Engineer at Sanmina SCI Systems (Alabama) Inc. James Odum brings experience from previous roles at Intel Corporation, TESCAN USA Inc. and WaferTech. James Odum holds a 1986 - 1990 A.A. plus 2yr Certification, Electron Microscopy in Electron Microscopy @ San Joaquin Delta College. With a robust skill set that includes SRAM, Scanning Electron Microscopy, EDX, TEM, Product Engineering and more. James Odum has 2 emails and 2 mobile phone numbers on RocketReach.
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