Defect & Yield Management , Inc. Information

DYM was incorporated in 1994 for the purpose of providing complete management solutions to the complex problems of real-time semiconductor defect reduction and yield enhancement.DYM's expertise is in:client/server system integration of software, databases, neural networks, data mining, and fuzzy logicgraphical user interfacesimage, inspection and test equipment interfacesMission StatementDYM's family of products:provides total solutions for defect reduction and yield enhancement for the semiconductor industry alwaysare responsive to its customers' continued search for production-worthy software solutionsadvance innovative technology as a solution for complex problemscontinue to be an industry standardCritical processes demand real-time, interactive solutions to succeed in today's business environment. The success of semiconductor products has become dependent on how quickly and how accurately individual processes can be analyzed and controlled. Failure to detect and correct problems in a timely manner results in lost resources and revenues, ruined product, and in missing key market milestones. Obviously, the ability to monitor process and contamination control equipment in real-time and the ability to mine data during a process step is vital for success in today's fab.Defining Real-Time Data ManagementIn assessing the data management and yield enhancement techniques used in the fab, one finds an enormous amount of process and inspection data locally contained in remote systems throughout the production floor. The data sets are often difficult to diagnose in a timely manner since they are in different formats on different types of systems and are widely scattered.What one typically sees are the bits and pieces of the puzzle, without seeing the entire overview in one glance.The problem is not one of too much or too little data, but rather one of collecting, sorting, analyzing and prioritizing these data in a form which facilitates the decision process. In other words, it is a data management problem.Automating data for increased productivity is our business.Critical manufacturing processes demand real-time, interactive solutions. The success of many semiconductor products have become increasingly dependent on how quickly and how accurately individual processes can be analyzed and controlled. DYM provides integrated defect analysis systems that permit users to access all aspects of semiconductor production from a single, easy-to-use interface.Currently, DYM focuses on serving semiconductor manufacturers with the development of four key products: Odyssey YMS(Yield Management System); Odyssey DDMS (Defect Data Management System), formerly sold by KLA-Tencor as Quest; VIT (Video Image Translator) and dataVision (a test analysis system acquired from LTX).Founders of Defect & Yield Management, Inc.Pay-shin King, Chairman of the Board of Directors and co-founder of DYM, Inc. has training as a Physicist and Electrical Engineer with over fifteen years of experience in the semiconductor industry contributing to defect inspection, automation, and management systems. He has been a senior manager and chief architect in the development of data management, design systems for defect inspection automation and E-tests.Dr. Mingche M. Li, President/CEO and cofounder of DYM, Inc., has a background as an Architect, as a Professor of Econometrics and Statistics at State University of New York at Stony Brook, and as the Director of Microcomputer Software at Abt Associates, Inc. before he founded MTI in 1983. He has over twenty years of experience in developing software for statistics, computer graphics, and communications.