Master of Science (M.S.) (Electrical and Computer Engineering)
2012-2014
University of Maryland
Bachelor of Science (B.S.) (Electrical Engineering)
2006-2010
Chris Peitsch Skills
Radiography
Computed Tomography
Materials Testing
NDT
Volume Graphics
Digital Image Processing
DoD
Matlab
High Performance Computing
Manufacturing
Engineering
Simulations
Systems Engineering
Engineering Management
Aerospace
Defense
Military
Management
Program Management
R&D
Composites
Testing
Security Clearance
U.S. Department of Defense
Research and Development (R&D)
Chris Peitsch Summary
Chris Peitsch, based in Washington, DC, US, is currently a Deputy Product Business Leader, Global X-ray at Nikon Metrology. Chris Peitsch brings experience from previous roles at NIKON METROLOGY, Nikon Metrology and The Johns Hopkins University Applied Physics Laboratory. Chris Peitsch holds a 2012 - 2014 Master of Science (M.S.) in Electrical and Computer Engineering @ University of Delaware. With a robust skill set that includes Radiography, Computed Tomography, Materials Testing, NDT, Volume Graphics and more. Chris Peitsch has 1 emails and 1 mobile phone numbers on RocketReach.
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