Materials Characterization Scientist @ (November 2016 - February 2019)
SEM Scientist @ (February 2002 - November 2016)
SEM Applications Scientist @ RJ Lee Instruments/Aspex (October 2000 - January 2002)
XPS Applications Scientist @ (April 1997 - October 2000)
Post-Doctoral Fellow @ (August 1995 - April 1997)
Brian Tielsch Education
Kent State University
Doctor of Philosophy - PhD (Analytical Chemistry)
1991-1995
Saint Vincent College
Bachelor of Science - BS (Chemistry)
1987-1991
Brian Tielsch Skills
Materials Science
R&D
Characterization
Engineering
Manufacturing
Materials
Chemistry
Project Management
Scanning Electron Microscopy
Microsoft Office
Scientist
Materials Characterization
Electron Optics
Surface Analysis
Failure Analysis
Scanning Electron Microscopy (SEM)
Root Cause Analysis
Energy Dispersive Spectroscopy (EDS)
Electron Backscatter Difraction (EBSD)
X-Ray Photoelectron Spectroscopy (XPS)
Auger Spectroscopy
Optical Microscopy
X-Ray Fluorescence (XRF)
Fourier-Transform Infrared Spectroscopy (FTIR)
Atomic Absorption (AA) Spectroscopy
Hall Cell Exposure
Microsoft Word
Microsoft PowerPoint
Microsoft Excel
EDAX OIM DC
EDAX OIM Analysis
EDAX Team Software
Bruker ESPIRIT Software
Budget
Sales
Marketing Materials
Trade Shows
Product Demonstration
Training
Travel
Brian Tielsch Summary
Brian Tielsch, based in Belle Vernon, PA, US, is currently a Materials Characterization Specialist at Basic Carbide Corp. Brian Tielsch brings experience from previous roles at Arconic, Alcoa, RJ Lee Instruments/Aspex and Kratos Analytical Ltd. Brian Tielsch holds a 1991 - 1995 Doctor of Philosophy - PhD in Analytical Chemistry @ Kent State University. With a robust skill set that includes Materials Science, R&D, Characterization, Engineering, Manufacturing and more. Brian Tielsch has 2 emails and 1 mobile phone numbers on RocketReach.
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