Master of Science (Materials Science and Engineering)
2010 - 2011
Carnegie Mellon University
Bachelor of Science (Materials Science and Engineering)
2007 - 2010
Strake Jesuit College Preparatory
H.S.
2003 - 2007
Brian Hoskins's Skills
Nanofabrication
C++
X Ray Crystallography
AFM
Reactive Sputtering
Low Current Measurements
C v Measurements
Atomic Layer Deposition
Electron Beam Induced Current Microscopy
Ellipsometry
Brian Hoskins's Summary
Brian Hoskins, based in Washington, DC, US, is currently a Program Manager, CHIPS Metrology at National Institute of Standards and Technology (NIST), bringing experience from previous roles at National Institute of Standards and Technology (NIST) and National Institute of Standards and Technology. Brian Hoskins holds a 2011 - 2016 Ph.D. in Materials Science @ University of California, Santa Barbara. With a robust skill set that includes Nanofabrication, C++, X Ray Crystallography, AFM, Reactive Sputtering and more, Brian Hoskins contributes valuable insights to the industry. Brian Hoskins has 2 emails on RocketReach.