2008 -
2016 CD Metrology Project Manager and Senior Member Technical Staff @
2001 -
2008 CD Metrology Project Manager (MTS) @
1998 -
2001 Lithography and Metrology Engineer @ Conexant
1996 -
1998 Lithography and Metrology Engineer @ Rockwell Semiconductor Systems
Benjamin Bunday Education
Cornell University
M.S./ABD (Materials Science & Engineering)
1991
-
1996
The University of Tulsa
B.S. (Engineering Physics)
1987
-
1991
J. J. Pearce High School
Graduate
1984
-
1987
Benjamin Bunday Summary
Benjamin Bunday, based in Schenectady, NY, US, is currently a President and CEO at AMAG nanometro. Benjamin Bunday brings experience from previous roles at AMAG Consulting, LLC, aBeam Technologies, Inc., GLOBALFOUNDRIES and SUNY Polytechnic Institute. Benjamin Bunday holds a 1991 - 1996 M.S./ABD in Materials Science & Engineering @ Cornell University. Benjamin Bunday has 3 emails and 3 mobile phone numbers on RocketReach.
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